{"created":"2024-10-25T07:19:32.060746+00:00","id":2002549,"links":{},"metadata":{"_buckets":{"deposit":"6f8fb88e-2aa8-469c-8a40-2f0c4a865950"},"_deposit":{"created_by":7,"id":"2002549","owners":[7],"pid":{"revision_id":0,"type":"depid","value":"2002549"},"status":"published"},"_oai":{"id":"oai:tokushima-u.repo.nii.ac.jp:02002549","sets":["1713829974766:1713833154310:1716340454209","1713853213384:1713853297799"]},"author_link":["1216"],"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2014-12","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"164","bibliographicPageStart":"149","bibliographicVolumeNumber":"22","bibliographic_titles":[{"bibliographic_title":"言語文化研究","bibliographic_titleLang":"ja"}]}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In this paper, an investigation was conducted to find whether or not fill-in-the-blank type English dictation tests could be used to measure students' English general ability by comparing scores of the TOEIC-IP test. In addition, the disadvantages of students filling in blanks on dictation tests in which they listen to English at natural speed were also examined. Substantiated evidence from data analysis results of dictation tests in advanced level classes correlated strongly with student scores of the TOEIC-IP test. These results suggest that dictation tests can be used to measure students' general English ability at the advanced level. Results also clarified weaknesses of students when filling in blanks during dictation tests are commonly irrespective of their English levels. It was also verified that the gap between advanced level English classes and basic level classes derived from the different learning levels of vocabulary, guessing skill, weak sound and mutation (t->r). In conclusion, when teaching classes especially at the basic level, it is extremely important for teachers to design lesson plans and assign homework on the basis of empirical test analysis for students to overcome these weaknesses.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10001_source_id_9":{"attribute_name":"収録物ID","attribute_value_mlt":[{"subitem_source_identifier":"13405632","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"AN10436724","subitem_source_identifier_type":"NCID"}]},"item_10001_version_type_20":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_1715043197608":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access"}]},"item_1723180141928":{"attribute_name":"EID","attribute_value_mlt":[{"subitem_identifier_type":"URI","subitem_identifier_uri":"289217"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"中島, 浩二","creatorNameLang":"ja"},{"creatorName":"ナカシマ, コウジ","creatorNameLang":"ja-Kana"},{"creatorName":"Nakashima, Kohji","creatorNameLang":"en"}],"familyNames":[{"familyName":"中島","familyNameLang":"ja"},{"familyName":"ナカシマ","familyNameLang":"ja-Kana"},{"familyName":"Nakashima","familyNameLang":"en"}],"givenNames":[{"givenName":"浩二","givenNameLang":"ja"},{"givenName":"コウジ","givenNameLang":"ja-Kana"},{"givenName":"Kohji","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"1216","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"73855/profile-ja.html","nameIdentifierScheme":"徳島大学 教育研究者総覧","nameIdentifierURI":"http://pub2.db.tokushima-u.ac.jp/ERD/person/73855/profile-ja.html"},{"nameIdentifier":"60272027","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/search/?qm=60272027"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_access","date":[{"dateType":"Available","dateValue":"2015-02-20"}],"displaytype":"detail","filename":"LID201502205007.pdf","filesize":[{"value":"651 KB"}],"format":"application/pdf","mimetype":"application/pdf","url":{"objectType":"fulltext","url":"https://tokushima-u.repo.nii.ac.jp/record/2002549/files/LID201502205007.pdf"},"version_id":"aa43a38b-aae6-4b09-99b7-d6982a699b4a"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"cloze-type English dictation test","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"correlation between dictation test and TOEIC-IP test","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"Japanese EFL university students","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"courses of different abilities","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"What Makes the Gap between Advanced Level Class and Basic One? Analysis of English Dictation Tests","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"What Makes the Gap between Advanced Level Class and Basic One? Analysis of English Dictation Tests","subitem_title_language":"en"}]},"item_type_id":"40001","owner":"7","path":["1713853297799","1716340454209"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2015-02-20"},"publish_date":"2015-02-20","publish_status":"0","recid":"2002549","relation_version_is_last":true,"title":["What Makes the Gap between Advanced Level Class and Basic One? Analysis of English Dictation Tests"],"weko_creator_id":"7","weko_shared_id":-1},"updated":"2025-01-31T06:22:51.527503+00:00"}