{"created":"2024-10-30T09:04:42.354697+00:00","id":2007199,"links":{},"metadata":{"_buckets":{"deposit":"e00da1db-0765-4c85-afad-83fbac2587d0"},"_deposit":{"created_by":7,"id":"2007199","owners":[7],"pid":{"revision_id":0,"type":"depid","value":"2007199"},"status":"published"},"_oai":{"id":"oai:tokushima-u.repo.nii.ac.jp:02007199","sets":["1713853213384:1713853295607"]},"author_link":["764"],"item_10001_alternative_title_1":{"attribute_name":"タイトル別表記","attribute_value_mlt":[{"subitem_alternative_title":"Infrared spectroscopy techniques for studying the electronic structures of materials under high-pressure","subitem_alternative_title_language":"en"}]},"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2017-04-21","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"5S3","bibliographicPageStart":"05FA11","bibliographicVolumeNumber":"56","bibliographic_titles":[{"bibliographic_title":"Japanese Journal of Applied Physics","bibliographic_titleLang":"en"}]}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In this article, we describe our high-pressure infrared (IR) spectroscopy techniques for studying the electronic structures of materials at high pressures. High pressure of up to 20 GPa is applied to a sample using a diamond anvil cell (DAC). To accurately perform IR spectroscopy in the limited sample space of a DAC, synchrotron radiation is used as a bright IR source. Our techniques allow reflectance studies of a single crystal sample and determination of the optical functions of the sample such as dielectric function and optical conductivity. To illustrate the capability and usefulness of our techniques, some actual results of high-pressure IR studies on rare-earth compounds are described.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"The Japan Society of Applied Physics","subitem_publisher_language":"en"}]},"item_10001_rights_15":{"attribute_name":"権利情報","attribute_value_mlt":[{"subitem_rights":"© 2017 The Japan Society of Applied Physics","subitem_rights_language":"en"}]},"item_10001_source_id_9":{"attribute_name":"収録物ID","attribute_value_mlt":[{"subitem_source_identifier":"13474065","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"00214922","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"AA12295836","subitem_source_identifier_type":"NCID"}]},"item_10001_version_type_20":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_ab4af688f83e57aa","subitem_version_type":"AM"}]},"item_1715043197608":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access"}]},"item_1722929371688":{"attribute_name":"出版社版DOI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_language":"ja","subitem_relation_name_text":"10.7567/JJAP.56.05FA11"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.7567/JJAP.56.05FA11","subitem_relation_type_select":"DOI"}}]},"item_1723180141928":{"attribute_name":"EID","attribute_value_mlt":[{"subitem_identifier_type":"URI","subitem_identifier_uri":"328528"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"岡村, 英一","creatorNameLang":"ja"},{"creatorName":"オカムラ, ヒデカズ","creatorNameLang":"ja-Kana"},{"creatorName":"Okamura, Hidekazu","creatorNameLang":"en"}],"familyNames":[{"familyName":"岡村","familyNameLang":"ja"},{"familyName":"オカムラ","familyNameLang":"ja-Kana"},{"familyName":"Okamura","familyNameLang":"en"}],"givenNames":[{"givenName":"英一","givenNameLang":"ja"},{"givenName":"ヒデカズ","givenNameLang":"ja-Kana"},{"givenName":"Hidekazu","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"764","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"292954/profile-ja.html","nameIdentifierScheme":"徳島大学 教育研究者総覧","nameIdentifierURI":"http://pub2.db.tokushima-u.ac.jp/ERD/person/292954/profile-ja.html"},{"nameIdentifier":"00273756","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/search/?qm=00273756"}]},{"creatorNames":[{"creatorName":"イケモト, ユカ","creatorNameLang":"ja"},{"creatorName":"イケモト, ユカ","creatorNameLang":"ja-Kana"},{"creatorName":"Ikemoto, Yuka","creatorNameLang":"en"}]},{"creatorNames":[{"creatorName":"モリワキ, タロウ","creatorNameLang":"ja"},{"creatorName":"モリワキ, タロウ","creatorNameLang":"ja-Kana"},{"creatorName":"Moriwaki, Taro","creatorNameLang":"en"}]},{"creatorNames":[{"creatorName":"ナンバ, タカオ","creatorNameLang":"ja"},{"creatorName":"ナンバ, タカオ","creatorNameLang":"ja-Kana"},{"creatorName":"Nanba, Takao","creatorNameLang":"en"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_access","date":[{"dateType":"Available","dateValue":"2020-03-11"}],"displaytype":"detail","filename":"jjap_56_5S3_05FA11.pdf","filesize":[{"value":"2.02 MB"}],"format":"application/pdf","mimetype":"application/pdf","url":{"objectType":"fulltext","url":"https://tokushima-u.repo.nii.ac.jp/record/2007199/files/jjap_56_5S3_05FA11.pdf"},"version_id":"9c45bd85-f4ef-443c-8a63-145173b1fa56"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Infrared spectroscopy techniques for studying the electronic structures of materials under high pressure","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Infrared spectroscopy techniques for studying the electronic structures of materials under high pressure","subitem_title_language":"en"}]},"item_type_id":"40001","owner":"7","path":["1713853295607"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2020-03-11"},"publish_date":"2020-03-11","publish_status":"0","recid":"2007199","relation_version_is_last":true,"title":["Infrared spectroscopy techniques for studying the electronic structures of materials under high pressure"],"weko_creator_id":"7","weko_shared_id":-1},"updated":"2025-02-10T07:32:44.783872+00:00"}