{"created":"2024-11-22T06:49:08.943497+00:00","id":2008285,"links":{},"metadata":{"_buckets":{"deposit":"2360ecda-e7b6-4a41-b969-f5e605cdaa31"},"_deposit":{"created_by":7,"id":"2008285","owners":[7],"pid":{"revision_id":0,"type":"depid","value":"2008285"},"status":"published"},"_oai":{"id":"oai:tokushima-u.repo.nii.ac.jp:02008285","sets":["1713853213384:1713853295607"]},"author_link":["32"],"control_number":"2008285","item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2018-03-20","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4","bibliographicPageStart":"042501","bibliographicVolumeNumber":"57","bibliographic_titles":[{"bibliographic_title":"Japanese Journal of Applied Physics","bibliographic_titleLang":"en"}]}]},"item_10001_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We propose a photon-counting (PC)-based quantitative-phase imaging (QPI) method for use in diffraction phase microscopy (DPM) that is combined with a single-pixel imaging (SPI) scheme (PC-SPI-DPM). This combination of DPM with the SPI scheme overcomes a low optical throughput problem that has occasionally prevented us from obtaining quantitative-phase images in DPM through use of a high-sensitivity single-channel photodetector such as a photomultiplier tube (PMT). The introduction of a PMT allowed us to perform PC with ease and thus solved a dynamic range problem that was inherent to SPI. As a proof-of-principle experiment, we performed a comparison study of analogue-based SPI-DPM and PC-SPI-DPM for a 125-nm-thick indium tin oxide (ITO) layer coated on a silica glass substrate. We discuss the basic performance of the method and potential future modifications of the proposed system.","subitem_description_language":"en","subitem_description_type":"Abstract"}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"The Japan Society of Applied Physics","subitem_publisher_language":"en"}]},"item_10001_rights_15":{"attribute_name":"権利情報","attribute_value_mlt":[{"subitem_rights":"Content from this work may be used under the terms of the Creative Commons Attribution 4.0 license. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.","subitem_rights_language":"en"}]},"item_10001_source_id_9":{"attribute_name":"収録物ID","attribute_value_mlt":[{"subitem_source_identifier":"13474065","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"00214922","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"AA12295836","subitem_source_identifier_type":"NCID"}]},"item_10001_version_type_20":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_1715043197608":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access"}]},"item_1722929371688":{"attribute_name":"出版社版DOI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_language":"ja","subitem_relation_name_text":"10.7567/JJAP.57.042501"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.7567/JJAP.57.042501","subitem_relation_type_select":"DOI"}}]},"item_1723180141928":{"attribute_name":"EID","attribute_value_mlt":[{"subitem_identifier_type":"URI","subitem_identifier_uri":"338037"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"シブヤ, キュウキ","creatorNameLang":"ja"},{"creatorName":"シブヤ, キュウキ","creatorNameLang":"ja-Kana"},{"creatorName":"Shibuya, Kyuki","creatorNameLang":"en"}]},{"creatorNames":[{"creatorName":"アラキ, ヒロユキ","creatorNameLang":"ja"},{"creatorName":"アラキ, ヒロユキ","creatorNameLang":"ja-Kana"},{"creatorName":"Araki, Hiroyuki","creatorNameLang":"en"}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":"","affiliationNameIdentifierScheme":"ISNI","affiliationNameIdentifierURI":"http://www.isni.org/isni/"}],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"岩田, 哲郎","creatorNameLang":"ja"},{"creatorName":"イワタ, テツオ","creatorNameLang":"ja-Kana"},{"creatorName":"Iwata, Tetsuo","creatorNameLang":"en"}],"familyNames":[{"familyName":"岩田","familyNameLang":"ja"},{"familyName":"イワタ","familyNameLang":"ja-Kana"},{"familyName":"Iwata","familyNameLang":"en"}],"givenNames":[{"givenName":"哲郎","givenNameLang":"ja"},{"givenName":"テツオ","givenNameLang":"ja-Kana"},{"givenName":"Tetsuo","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"32","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"10640/profile-ja.html","nameIdentifierScheme":"徳島大学 教育研究者総覧","nameIdentifierURI":"http://pub2.db.tokushima-u.ac.jp/ERD/person/10640/profile-ja.html"},{"nameIdentifier":"50304548","nameIdentifierScheme":"e-Rad","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/search/?qm=50304548"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_access","date":[{"dateType":"Available","dateValue":"2021-02-18"}],"displaytype":"detail","filename":"jjap_57_4_042501.pdf","filesize":[{"value":"944 KB"}],"format":"application/pdf","licensetype":"license_0","mimetype":"application/pdf","url":{"objectType":"fulltext","url":"https://tokushima-u.repo.nii.ac.jp/record/2008285/files/jjap_57_4_042501.pdf"},"version_id":"6e331035-3e29-4aa7-a88a-fb1878ae4f60"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Photon-counting-based diffraction phase microscopy combined with single-pixel imaging","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Photon-counting-based diffraction phase microscopy combined with single-pixel imaging","subitem_title_language":"en"}]},"item_type_id":"40001","owner":"7","path":["1713853295607"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2021-02-18"},"publish_date":"2021-02-18","publish_status":"0","recid":"2008285","relation_version_is_last":true,"title":["Photon-counting-based diffraction phase microscopy combined with single-pixel imaging"],"weko_creator_id":"7","weko_shared_id":-1},"updated":"2025-01-27T06:18:00.181053+00:00"}