{"created":"2025-03-04T09:15:30.527767+00:00","id":2012791,"links":{},"metadata":{"_buckets":{"deposit":"f1d55ee3-2e5b-474d-86e2-a128a5516c8f"},"_deposit":{"created_by":8,"id":"2012791","owners":[8],"pid":{"revision_id":0,"type":"depid","value":"2012791"},"status":"published"},"_oai":{"id":"oai:tokushima-u.repo.nii.ac.jp:02012791","sets":["1713853213384:1713853295607"]},"author_link":["93"],"control_number":"2012791","item_10001_alternative_title_1":{"attribute_name":"タイトル別表記","attribute_value_mlt":[{"subitem_alternative_title":"Test Techniques for 3D-ICs","subitem_alternative_title_language":"en"}]},"item_10001_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2023-11-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"7","bibliographicPageEnd":"674","bibliographicPageStart":"669","bibliographicVolumeNumber":"26","bibliographic_titles":[{"bibliographic_title":"エレクトロニクス実装学会誌","bibliographic_titleLang":"ja"},{"bibliographic_title":"Journal of The Japan Institute of Electronics Packaging","bibliographic_titleLang":"en"}]}]},"item_10001_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"エレクトロニクス実装学会","subitem_publisher_language":"ja"}]},"item_10001_source_id_9":{"attribute_name":"収録物ID","attribute_value_mlt":[{"subitem_source_identifier":"13439677","subitem_source_identifier_type":"PISSN"},{"subitem_source_identifier":"1884121X","subitem_source_identifier_type":"EISSN"},{"subitem_source_identifier":"AA11231565","subitem_source_identifier_type":"NCID"}]},"item_10001_version_type_20":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_1715043197608":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_1722929371688":{"attribute_name":"出版社版DOI","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_language":"ja","subitem_relation_name_text":"10.5104/jiep.26.669"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://doi.org/10.5104/jiep.26.669","subitem_relation_type_select":"DOI"}}]},"item_1723180141928":{"attribute_name":"EID","attribute_value_mlt":[{"subitem_identifier_type":"URI","subitem_identifier_uri":"403751"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"四柳, 浩之","creatorNameLang":"ja"},{"creatorName":"ヨツヤナギ, ヒロユキ","creatorNameLang":"ja-Kana"},{"creatorName":"Yotsuyanagi, Hiroyuki","creatorNameLang":"en"}],"familyNames":[{"familyName":"四柳","familyNameLang":"ja"},{"familyName":"ヨツヤナギ","familyNameLang":"ja-Kana"},{"familyName":"Yotsuyanagi","familyNameLang":"en"}],"givenNames":[{"givenName":"浩之","givenNameLang":"ja"},{"givenName":"ヒロユキ","givenNameLang":"ja-Kana"},{"givenName":"Hiroyuki","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"93","nameIdentifierScheme":"WEKO"},{"nameIdentifier":"10737/profile-ja.html","nameIdentifierScheme":"徳島大学 教育研究者総覧","nameIdentifierURI":"http://pub2.db.tokushima-u.ac.jp/ERD/person/10737/profile-ja.html"},{"nameIdentifier":"90304550","nameIdentifierScheme":"e-Rad_Researcher","nameIdentifierURI":"https://nrid.nii.ac.jp/ja/search/?qm=90304550"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_access","date":[{"dateType":"Available","dateValue":"2024-01-01"}],"displaytype":"detail","filename":"jiep_26_7_669.pdf","filesize":[{"value":"1.3 MB"}],"format":"application/pdf","mimetype":"application/pdf","url":{"objectType":"fulltext","url":"https://tokushima-u.repo.nii.ac.jp/record/2012791/files/jiep_26_7_669.pdf"},"version_id":"cb4e0fef-e9be-4543-b717-26cbbefc3791"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"3D-ICのテスト技術","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"3D-ICのテスト技術","subitem_title_language":"ja"}]},"item_type_id":"40001","owner":"8","path":["1713853295607"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2025-03-21"},"publish_date":"2025-03-21","publish_status":"0","recid":"2012791","relation_version_is_last":true,"title":["3D-ICのテスト技術"],"weko_creator_id":"8","weko_shared_id":-1},"updated":"2025-03-21T10:18:53.962516+00:00"}