Item type |
文献 / Documents(1) |
公開日 |
2019-09-11 |
アクセス権 |
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アクセス権 |
open access |
資源タイプ |
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資源タイプ識別子 |
http://purl.org/coar/resource_type/c_6501 |
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資源タイプ |
journal article |
出版社版DOI |
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識別子タイプ |
DOI |
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関連識別子 |
https://doi.org/10.1364/OPTICA.5.000634 |
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言語 |
ja |
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関連名称 |
10.1364/OPTICA.5.000634 |
出版タイプ |
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出版タイプ |
VoR |
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出版タイプResource |
http://purl.org/coar/version/c_970fb48d4fbd8a85 |
タイトル |
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タイトル |
Scan-less confocal phase imaging based on dual-comb microscopy |
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言語 |
en |
著者 |
長谷, 栄治
南川, 丈夫
水野, 孝彦
ミヤモト, シュウジ
イチカワ, リュウジ
謝, 宜達
シブヤ, キュウキ
佐藤, 克也
中嶋, 善晶
アサハラ, アキフミ
美濃島, 薫
水谷, 康弘
岩田, 哲郎
山本, 裕紹
安井, 武史
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抄録 |
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内容記述タイプ |
Abstract |
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内容記述 |
Confocal laser microscopy (CLM) is a powerful tool in life science research and industrial inspection because it offers two-dimensional optical sectioning or three-dimensional imaging capability with micrometer depth selectivity. Furthermore, scan-less imaging modality enables rapid image acquisition and high robustness against surrounding external disturbances in CLM. However, the objects to be measured must be reflective, absorptive, scattering, or fluorescent because the image contrast is given by the optical intensity. If a new image contrast can be provided by the optical phase, scan-less CLMcan be further applied for transparent non-fluorescent objects or reflective objects with nanometer unevenness by providing information on refractive index, optical thickness, or geometrical shape. Here, we report scan-less confocal dual-comb microscopy offering a phase image in addition to an amplitude image with depth selectivity by using an optical frequency comb as an optical carrier of amplitude and phase with discrete ultra-multichannels. Our technique encodes confocal amplitude and phase images of a sample onto a series of discrete modes in the optical frequency comb with well-defined amplitude and phase to establish a one-to-one correspondence between image pixels and comb modes. The technique then decodes these images from comb modes with amplitude and phase. We demonstrate confocal phase imaging with milliradian phase resolution under micrometer depth selectivity on the millisecond timescale. As a proof of concept, we demonstrate the quantitative phase imaging of standing culture fixed cells and the surface topography of nanometer-scale step structures. Our technique for confocal phase imaging will find applications in three-dimensional visualization of stacked living cells in culture and nanometer surface topography of semiconductor objects. |
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言語 |
en |
書誌情報 |
en : Optica
巻 5,
号 5,
p. 634-643,
発行日 2018-05-16
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収録物ID |
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収録物識別子タイプ |
ISSN |
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収録物識別子 |
23342536 |
出版者 |
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出版者 |
OSA publishing |
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言語 |
en |
権利情報 |
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言語 |
en |
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権利情報 |
This is an open access article distributed under a Creative Commons license. |
EID |
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識別子 |
342200 |
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識別子タイプ |
URI |
言語 |
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言語 |
eng |