| Item type |
文献 / Documents(1) |
| 公開日 |
2021-08-19 |
| アクセス権 |
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|
アクセス権 |
open access |
| 資源タイプ |
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資源タイプ識別子 |
http://purl.org/coar/resource_type/c_6501 |
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資源タイプ |
journal article |
| 出版社版DOI |
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識別子タイプ |
DOI |
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関連識別子 |
https://doi.org/10.1103/PhysRevB.103.115134 |
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言語 |
ja |
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|
関連名称 |
10.1103/PhysRevB.103.115134 |
| 出版タイプ |
|
|
出版タイプ |
VoR |
|
出版タイプResource |
http://purl.org/coar/version/c_970fb48d4fbd8a85 |
| タイトル |
|
|
タイトル |
Robust hybridization gap in the Kondo insulator YbB12 probed by femtosecond optical spectroscopy |
|
言語 |
en |
| 著者 |
Pokharel, A. R.
Agustsson, S. Y.
Kabanov, V. V.
イガ
タカバタケ
岡村, 英一
Demsar, J.
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| 抄録 |
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内容記述タイプ |
Abstract |
|
内容記述 |
In heavy fermions the relaxation dynamics of photoexcited carriers has been found to be governed by the low energy indirect gap Eg resulting from hybridization between localized moments and conduction band electrons. Here, carrier relaxation dynamics in a prototype Kondo insulator YbB12 is studied over a large range of temperatures and over three orders of magnitude. We utilize the intrinsic nonlinearity of dynamics to quantitatively determine microscopic parameters, such as electron-hole recombination rate. The extracted value reveals that hybridization is accompanied by a strong charge transfer from localized 4 f levels. The results imply the presence of a hybridization gap up to temperatures of the order of Eg/kB ≈ 200 K, which is extremely robust against electronic excitation. Finally, below 20 K the data reveal changes in the low energy electronic structure, attributed to short-range antiferromagnetic correlations between the localized levels. |
|
言語 |
en |
| 書誌情報 |
en : Physical Review B
巻 103,
号 11,
p. 115134,
発行日 2021-03-18
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| 収録物ID |
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収録物識別子タイプ |
ISSN |
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収録物識別子 |
24699950 |
| 収録物ID |
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収録物識別子タイプ |
ISSN |
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収録物識別子 |
24699969 |
| 収録物ID |
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収録物識別子タイプ |
NCID |
|
収録物識別子 |
AA11187113 |
| 出版者 |
|
|
出版者 |
American Physical Society |
|
言語 |
en |
| 権利情報 |
|
|
言語 |
en |
|
権利情報 |
©2021 American Physical Society |
| EID |
|
|
識別子 |
379461 |
|
識別子タイプ |
URI |
| 言語 |
|
|
言語 |
eng |
physrevb_103_11_115134.pdf (627 KB)
