| Item type |
文献 / Documents(1) |
| 公開日 |
2023-02-27 |
| アクセス権 |
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|
アクセス権 |
open access |
| 資源タイプ |
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資源タイプ識別子 |
http://purl.org/coar/resource_type/c_6501 |
|
資源タイプ |
journal article |
| 出版社版DOI |
|
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|
関連識別子 |
https://doi.org/10.1126/sciadv.abo4021 |
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関連名称 |
10.1126/sciadv.abo4021 |
| 出版タイプ |
|
|
出版タイプ |
VoR |
|
出版タイプResource |
http://purl.org/coar/version/c_970fb48d4fbd8a85 |
| タイトル |
|
|
タイトル |
Ultrastable tip-enhanced hyperspectral optical nanoimaging for defect analysis of large-sized WS2 layers |
| 著者 |
加藤, 遼
モリヤマ, トキ
ウマコシ, タカユキ
矢野, 隆章
Verma, Prabhat
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| 抄録 |
|
|
内容記述 |
Optical nanoimaging techniques, such as tip-enhanced Raman spectroscopy (TERS), are nowadays indispensable for chemical and optical characterization in the entire field of nanotechnology and have been extensively used for various applications, such as visualization of nanoscale defects in two-dimensional (2D) materials. However, it is still challenging to investigate micrometer-sized sample with nanoscale spatial resolution because of severe limitation of measurement time due to drift of the experimental system. Here, we achieved long-duration TERS imaging of a micrometer-sized WS2 sample for 6 hours in a reproducible manner. Our ultrastable TERS system enabled to reveal the defect density on the surface of tungsten disulfide layers in large area equivalent to the device scale. It also helped us to detect rare defect-related optical signals from the sample. The present study paves ways to evaluate nanoscale defects of 2D materials in large area and to unveil remarkable optical and chemical properties of large-sized nanostructured materials. |
| 書誌情報 |
en : Science Advances
巻 8,
号 28,
p. eabo4021,
発行日 2022-07-15
|
| 収録物ID |
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収録物識別子タイプ |
ISSN |
|
収録物識別子 |
23752548 |
| 出版者 |
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出版者 |
American Association for the Advancement of Science |
| 権利情報 |
|
|
権利情報 |
© 2022 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Works. Distributed under a Creative Commons Attribution License 4.0 (CC BY). |
| EID |
|
|
識別子 |
395678 |
| 言語 |
|
|
言語 |
eng |
sciadv_8_28_eabo4021.pdf (3.27 MB)
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